FLOOXS » Test Decks
Test Decks
577 deck(s) under Test/, grouped by category.
BadInput (23)
Test/BadInput/bad_alagator_densenn_arity.tcl— Alagator densenn() with wrong input arity (model in_dim != args count)Test/BadInput/bad_alagator_densenn_multi_out.tcl— Alagator densenn() with a multi-output model is rejected — alagatorTest/BadInput/bad_alagator_densenn_unknown.tcl— Alagator densenn("name", ...) referencing a model that isn't registeredTest/BadInput/bad_alagator_tspline_arity.tcl— Alagator tspline() with input arity != table's axis count mustTest/BadInput/bad_alagator_tspline_unknown.tcl— Alagator tspline("name", ...) referencing a table that isn't registeredTest/BadInput/bad_contact_flux_unknown_sol.tcl— bad_contact_flux_unknown_sol.tcl — contact flux with sol= naming a non-existent solutionTest/BadInput/bad_contact_underscore_name.tcl— bad_contact_underscore_name.tcl — contact name= containing an underscoreTest/BadInput/bad_flash_no_args.tcl— bad_flash_no_args.tcl — bare `flash` with no movie= argumentTest/BadInput/bad_implant_no_args.tcl— bad_implant_no_args.tcl — implant called with no arguments at allTest/BadInput/bad_init_no_region.tcl— bad_init_no_region.tcl — init called with line commands but no region definedTest/BadInput/bad_interpolate_no_field.tcl— bad_interpolate_no_field.tcl — interpolate called without a prior selTest/BadInput/bad_machine_no_args.tcl— bad_machine_no_args.tcl — bare `machine` with no name=Test/BadInput/bad_mask_no_args.tcl— bad_mask_no_args.tcl — mask called with no parametersTest/BadInput/bad_mater_alias_no_name.tcl— bad_mater_alias_no_name.tcl — `mater alias=Foo` without `name=`Test/BadInput/bad_mater_inherit_no_name.tcl— bad_mater_inherit_no_name.tcl — `mater inherit=Silicon` without `name=`Test/BadInput/bad_mater_no_args.tcl— bad_mater_no_args.tcl — bare `mater` with no argumentsTest/BadInput/bad_newregrid3d_1d_mesh.tcl— bad_newregrid3d_1d_mesh.tcl — `newregrid3d` on a 1D meshTest/BadInput/bad_newton_empty_eqn.tcl— bad_newton_empty_eqn.tcl — newton with valid var but an empty eqn stringTest/BadInput/bad_newton_undefined_var.tcl— bad_newton_undefined_var.tcl — newton with var= referring to a solution that doesn't existTest/BadInput/bad_newton_unknown_field.tcl— bad_newton_unknown_field.tcl — newton with valid var but eqn referencing an undefined symbolTest/BadInput/bad_pen_no_args.tcl— bad_pen_no_args.tcl — bare `pen` with no name= argumentTest/BadInput/bad_region_zero_extent.tcl— bad_region_zero_extent.tcl — region with xlo == xhi (zero-extent)Test/BadInput/bad_test_adapt_1d_mesh.tcl— bad_test_adapt_1d_mesh.tcl — `test_adapt` on a 1D mesh
Coverage (364)
Test/Coverage/cov_2d_diffuse_interface.tcl— 2D diffusion with multi-material interfaceTest/Coverage/cov_2d_refine_facecentroid.tcl— 2D internal refine: face (Tri) centroid point insertion. In 2D theTest/Coverage/cov_3d_adapt_remove.tcl— 3D mesh with diffusion and grid adaptationTest/Coverage/cov_3d_diffuse.tcl— Test 3D diffuse solve (exercises 3D element assembly paths)Test/Coverage/cov_3d_diffuse_tet.tcl— 3D diffusion on tetrahedral meshTest/Coverage/cov_3d_etch_options.tcl— 3D etch with internal and tetgen meshing optionsTest/Coverage/cov_3d_extended_ops.tcl— Exercise 3D mesh operations, struct write, and grid queriesTest/Coverage/cov_3d_geometry.tcl— cov_3d_geometry.tcl -- Exercise 3D geometry paths in Tet.cc, Pent.cc, Brick.cc, Volume.ccTest/Coverage/cov_3d_mesh_ops.tcl— Test 3D mesh element operations (Brick, Face, Edge paths)Test/Coverage/cov_3d_multi_region.tcl— 3D multi-region mesh with interfaceTest/Coverage/cov_3d_multiregion_write.tcl— Exercise 3D multi-region struct write and element iterationTest/Coverage/cov_3d_refine_internal.tcl— 3D internal refine: volume + face centroid point insertion (defaultTest/Coverage/cov_3d_refine_reduce.tcl— 3D internal refine (edge-split + reduce) and Prism element testTest/Coverage/cov_3d_tet_mesh.tcl— 3D tetrahedral mesh operationsTest/Coverage/cov_ac_iterative.tcl— AC solver with iterative (BiCGStab) instead of direct (UMF)Test/Coverage/cov_ac_solver.tcl— Minimal AC (small-signal) solver testTest/Coverage/cov_adapt_delaunay.tcl— Test 2D mesh adaptation with Delaunay refinementTest/Coverage/cov_adapt_distance.tcl— Test Adapt distance computation and grid loop pathsTest/Coverage/cov_adapt_edgecoll.tcl— Test mesh adaptation with edge collapse and refinement via C++ harnessTest/Coverage/cov_adapt_gridadd.tcl— Test GridAdd and GridAddPerp paths during levelset depositTest/Coverage/cov_adapt_interior.tcl— Test interior (non-skeletal) AdaptRefine path via C++ test harnessTest/Coverage/cov_adapt_refine_1d.tcl— Test AdaptRefine + CollapseAllowed scoring via C++ test harnessTest/Coverage/cov_adapt_remove.tcl— Test mesh adaptation triggered by diffusion regridTest/Coverage/cov_adapt_split.tcl— Exercise Mesh::Split and Mesh::Glue pathsTest/Coverage/cov_airy.tcl— cov_airy.tcl — coverage test for src/math/airy.ccTest/Coverage/cov_alagator_densenn.tcl— cov_alagator_densenn.tcl — embed a trained densenn inside an alagatorTest/Coverage/cov_alagator_floor.tcl— cov_alagator_floor.tcl -- floor() and ceil() in Alagator.Test/Coverage/cov_alagator_hyperbolic.tcl— cov_alagator_hyperbolic.tcl -- hyperbolic functions in Alagator.Test/Coverage/cov_alagator_tspline.tcl— cov_alagator_tspline.tcl — embed a tspline table inside an alagator PDETest/Coverage/cov_algan_eqns.tcl— AlGaN/AlN equations loading test.Test/Coverage/cov_animesh_cubic.tcl— Exercise AniMesh::InterpolateCubic via the `anicubic` Tcl wrapper.Test/Coverage/cov_aschro_field_coeff.tcl— DataField coefficient in complex H= assembly path coverageTest/Coverage/cov_aschro_high_order.tcl— Higher-order aschro coverageTest/Coverage/cov_avgstress_3d.tcl— averagestress3d and peak command coverageTest/Coverage/cov_basedata_node_ops.tcl— Exercise BaseData and Node operationsTest/Coverage/cov_basedata_setname_collision.tcl— BaseData::SetName cross-type collision guardTest/Coverage/cov_bc_types.tcl— Test various boundary condition typesTest/Coverage/cov_bem_1d.tcl— BEM Laplace test — 2D oxide-onlyTest/Coverage/cov_bem_3d.tcl— 3D BEM Laplace infrastructure testTest/Coverage/cov_blasbcgs.tcl— Test BLAS-based BiCGStab solver pathTest/Coverage/cov_block_precond.tcl— Test block-diagonal preconditioner (math/block.cc)Test/Coverage/cov_boundary_types.tcl— cov_boundary_types.tcl -- Exercise boundary condition paths in Genbc.cc and EleBoundInfo.ccTest/Coverage/cov_btbt.tcl— Minimal band-to-band tunneling test (Germanium, one bias point)Test/Coverage/cov_calcstress_3d.tcl— 3D mesh operations for geometry coverageTest/Coverage/cov_circuit_ac.tcl— cov_circuit_ac.tcl — AC small-signal analysis of an RC circuitTest/Coverage/cov_circuit_dc.tcl— cov_circuit_dc.tcl — standalone DC circuit solver coverage testTest/Coverage/cov_circuit_ddt_ac.tcl— cov_circuit_ddt_ac.tcl — RC AC at three different frequencies WITHOUTTest/Coverage/cov_circuit_inductor.tcl— cov_circuit_inductor.tcl — RL step response (validates `flux` + ddt(flux))Test/Coverage/cov_circuit_mesh.tcl— cov_circuit_mesh.tcl — circuit-mesh interface via voltage contactsTest/Coverage/cov_circuit_mesh_ac.tcl— cov_circuit_mesh_ac.tcl — mesh-coupled AC small-signal analysisTest/Coverage/cov_circuit_mesh_transient.tcl— cov_circuit_mesh_transient.tcl — mesh-coupled transient analysisTest/Coverage/cov_circuit_nonlin_converge.tcl— cov_circuit_nonlin_converge.tcl — regression for the Newton circuit-nodeTest/Coverage/cov_circuit_supply.tcl— cov_circuit_supply.tcl -- direct regression for `circuit supply`.Test/Coverage/cov_circuit_transient.tcl— cov_circuit_transient.tcl — BDF1 transient analysis of an RC circuitTest/Coverage/cov_complex.tcl— Exercise complex-number expression evaluation in sel: real(), imag(),Test/Coverage/cov_complex_abs_rqi.tcl— Coverage test for:Test/Coverage/cov_complex_ac.tcl— ============================================================================Test/Coverage/cov_complex_autodetect.tcl— Complex Newton solve with auto-detection — no "math diffuse complex"Test/Coverage/cov_complex_eigen.tcl— Test Eigen sparse solver variants — real and complexTest/Coverage/cov_complex_mesh_adapt.tcl— Cov-ComplexMeshAdapt — bring ComplexData fields through mesh-adapt andTest/Coverage/cov_complex_newton.tcl— Complex Newton solve — exercises UMFComplex, complex matrix assembly,Test/Coverage/cov_complex_pde.tcl— ============================================================================Test/Coverage/cov_comprow_matrix.tcl— Test CompRowMatrix pathsTest/Coverage/cov_contact_current.tcl— cov_contact_current.tcl -- CURRENT-mode contact end-to-end.Test/Coverage/cov_contact_flux_compare.tcl— Compare Newton flux vs gradient-integral flux using FEQF on a 2D N-type resistorTest/Coverage/cov_contact_integrate.tcl— Contact integrate= and normal= coverage testTest/Coverage/cov_contact_network.tcl— cov_contact_network.tcl -- NETWORK-mode contact wired to SPICE network.Test/Coverage/cov_context_dump.tcl— Cov-ContextDump — exercise the LLM context-bundle generatorTest/Coverage/cov_coordinate_ops.tcl— Test Coordinate.cc and AniMesh.cc pathsTest/Coverage/cov_coupled_pde_2var.tcl— Coupled 2-variable PDE with nonlinear termsTest/Coverage/cov_crossconnect_2d.tcl— CrossConnect 2D surface field server constructionTest/Coverage/cov_debug_write_paths.tcl— Exercise write/BuildString paths via options debugTest/Coverage/cov_densenn.tcl— cov_densenn.tcl — coverage for src/analysis/nn/densenn.ccTest/Coverage/cov_device_bandgap.tcl— Doping profile operationsTest/Coverage/cov_device_doping_types.tcl— Device simulation with doping profile setupTest/Coverage/cov_diffcontrol_modes.tcl— Exercise DiffControl.cc paths: ramp rate, userstep, damp.trbdf, reloadTest/Coverage/cov_diffuse_adapt_damp.tcl— Test DiffController adaptation and TRBDF damping pathsTest/Coverage/cov_diffuse_anisotropic.tcl— Diffusion with material property variationTest/Coverage/cov_diffuse_dirichlet.tcl— Diffusion with Dirichlet boundary conditionsTest/Coverage/cov_diffuse_interface.tcl— Multi-region diffusionTest/Coverage/cov_diffuse_modes.tcl— cov_diffuse_modes.tcl -- Exercise different diffuse modes in DiffControl.ccTest/Coverage/cov_diffuse_ramp.tcl— Diffusion with temperature ramp, smooth, and trbdf dampingTest/Coverage/cov_diffuse_solver_modes.tcl— Test different diffuse solver configurationsTest/Coverage/cov_diffuse_temperature.tcl— Temperature-dependent diffusionTest/Coverage/cov_diffuse_tensor.tcl— Diffusion with tensor (anisotropic) diffusivityTest/Coverage/cov_diffuse_wind.tcl— Test diffusion with mesh movement (wind smoothing)Test/Coverage/cov_docgen.tcl— Cov-Docgen — exercise the HTML reference generatorTest/Coverage/cov_edge_tri_ops.tcl— cov_edge_tri_ops.tcl -- Exercise Edge.cc and Tri.cc geometry pathsTest/Coverage/cov_eigen_matrix.tcl— Test Eigen sparse matrix paths (EigenCCMatrix, EigenCRMatrix)Test/Coverage/cov_eigen_scaled.tcl— Test Eigen matrix paths with scaling enabled (RowScale, ColScale)Test/Coverage/cov_elastic_3d.tcl— 3D stress/strain assembly — Elastic.cc Ddim=6 pathsTest/Coverage/cov_elastic_stress.tcl— Exercise 1D stress path in Elastic.ccTest/Coverage/cov_eleboundinfo.tcl— Exercise EleBoundInfo.cc boundary element info pathsTest/Coverage/cov_element_extended.tcl— Exercise Element.cc extended pathsTest/Coverage/cov_etch_anisotropic.tcl— Test anisotropic etch operationsTest/Coverage/cov_etch_velocity_modes.tcl— Etch velocity modes coverage testTest/Coverage/cov_expr_conditional.tcl— cov_expr_conditional.tcl -- Exercise RelExpr and IFTExpr paths in Expr.ccTest/Coverage/cov_expr_conditional_pde.tcl— Exercise conditional/relational expression paths in PDE assembly contextTest/Coverage/cov_expr_datafield.tcl— cov_expr_datafield.tcl -- Exercise DataField expression paths in Expr.ccTest/Coverage/cov_expr_deriv.tcl— cov_expr_deriv.tcl -- Exercise symbolic derivative paths in Expr.ccTest/Coverage/cov_expr_deriv_extended.tcl— Exercise additional Derivative paths in Expr.ccTest/Coverage/cov_expr_extended.tcl— Extended expression operator coverageTest/Coverage/cov_expr_fermi_quad.tcl— Exercise Fermi-Dirac function pathsTest/Coverage/cov_expr_fsc_pde_ext.tcl— Exercise fsc/d1fsc/d2fsc in PDE equation context (ForceNodeEval + QuadDerivative)Test/Coverage/cov_expr_functions.tcl— Test Alagator expression function derivatives during Newton solveTest/Coverage/cov_expr_grad_2d.tcl— cov_expr_grad_2d.tcl -- Exercise GradX/GradY/MagGrad paths in 2D expressionsTest/Coverage/cov_expr_log10_deriv.tcl— Exercise log10 derivative in Newton contextTest/Coverage/cov_expr_math_ops.tcl— Expression math operations coverage testTest/Coverage/cov_expr_mechanics.tcl— Expression mechanics and select command extended pathsTest/Coverage/cov_expr_pde_operators.tcl— Extended PDE expression operators for coverageTest/Coverage/cov_expr_pde_terms.tcl— cov_expr_pde_terms.tcl -- Exercise additional PDE term types in PartTerm.ccTest/Coverage/cov_expr_quad.tcl— cov_expr_quad.tcl -- Exercise QuadEvaluate/QuadDerivative paths in Expr.ccTest/Coverage/cov_expr_quad_2d.tcl— cov_expr_quad_2d.tcl -- Exercise QuadEvaluate paths in 2D PDE assemblyTest/Coverage/cov_expr_quad_extended.tcl— cov_expr_quad_extended.tcl -- Exercise remaining QuadEvaluate/QuadDerivative casesTest/Coverage/cov_expr_quad_funcs.tcl— Exercise QuadEvaluate and QuadDerivative paths for functions in PDE equationsTest/Coverage/cov_expr_quad_misc.tcl— Exercise miscellaneous QuadEvaluate paths: sign, randn, abs, log, exp, sqrtTest/Coverage/cov_expr_quad_pow.tcl— Exercise QuadEvaluate/QuadDerivative for pow expressions with data fieldsTest/Coverage/cov_expr_quad_relop.tcl— Exercise QuadEvaluate/QuadDerivative for relational and conditional expressionsTest/Coverage/cov_expr_quadderiv.tcl— Exercise QuadDerivative paths for mixed data-field + solution expressionsTest/Coverage/cov_expr_quadeval_trig.tcl— Exercise QuadEvaluate paths for trig functionsTest/Coverage/cov_expr_reduction.tcl— Expression reduction and complex Alagator expressionsTest/Coverage/cov_expr_sc_quad.tcl— Exercise superconductor function evaluation pathsTest/Coverage/cov_expr_sign_fsc.tcl— Exercise uncovered expression paths in Expr.cc FuncExpr::ComputeTest/Coverage/cov_expr_trig_pde.tcl— Exercise trig function QuadEvaluate and Derivative paths in PDE assemblyTest/Coverage/cov_face_ops.tcl— cov_face_ops.tcl -- Exercise Face.cc and Volume.cc geometry paths in 3DTest/Coverage/cov_fe_step.tcl— Cov-FEStep — smoke test for `fe_step` Tcl command (src/BasePDE/FEStep.cc).Test/Coverage/cov_fftmesh.tcl— FFT mesh operations — forward and inverse FFT on 1D meshTest/Coverage/cov_field_data_basic.tcl— Test basic field data operations and field expressionsTest/Coverage/cov_field_data_boolops.tcl— Test BoolData and multi-type field operations through struct round tripsTest/Coverage/cov_field_data_ops.tcl— Test Data module operations via C++ test harnessTest/Coverage/cov_field_data_range.tcl— Test field Range and print.1d pathsTest/Coverage/cov_field_data_types.tcl— Test field data type operations via struct I/O round tripsTest/Coverage/cov_field_interface_ops.tcl— Field operations across material interfacesTest/Coverage/cov_field_interpolation.tcl— Test field operations with interpolationTest/Coverage/cov_field_mesh_extended.tcl— Extended field mesh operations targeting Element.cc, Edge.cc, Tri.cc, Quad.ccTest/Coverage/cov_field_operations.tcl— Test field operations and mesh queriesTest/Coverage/cov_fieldserver_ops.tcl— Exercise FieldServer operations and mesh management pathsTest/Coverage/cov_fit.tcl— cov_fit.tcl — coverage for src/analysis/fit/fit.ccTest/Coverage/cov_fs_units_add.tcl— Cov-FS-Units-Add: units= on fs add overrides the global default. GlobalTest/Coverage/cov_fs_units_clear.tcl— Cov-FS-Units-Clear: `fs clearunits` drops a local override and returnsTest/Coverage/cov_fs_units_fallback.tcl— Cov-FS-Units-Fallback: fs without -units falls back to the globalTest/Coverage/cov_fs_units_global.tcl— Cov-FS-Units-Global: baseline. No per-fs units anywhere. The integrateTest/Coverage/cov_fs_units_help.tcl— Cov-FS-Units-Help: the new `units` and `clearunits` switches areTest/Coverage/cov_fs_units_legacy.tcl— Cov-FS-Units-Legacy: a structure file that was written WITHOUT aTest/Coverage/cov_fs_units_multiserver.tcl— Cov-FS-Units-MultiServer: multiple fs's with different local units.Test/Coverage/cov_fs_units_save.tcl— Cov-FS-Units-Save: structure write/read round-trip carries the unitsTest/Coverage/cov_fs_units_set.tcl— Cov-FS-Units-Set: `fs units= ...` on a current fs takes effect forTest/Coverage/cov_fsc_pde.tcl— Fermi-Dirac integrals in PDE equation contextTest/Coverage/cov_furnace_rta.tcl— Furnace and RTA anneal coverage testTest/Coverage/cov_gan_convergence.tcl— GaN 1D PN diode convergence test.Test/Coverage/cov_gan_eqns.tcl— GaN on 4H-SiC test.Test/Coverage/cov_genbc_interface.tcl— Exercise GenericBC interface equation paths in Genbc.ccTest/Coverage/cov_geometry_3d_ops.tcl— Test 3D geometry element operations (Tet, Pent, Volume, Face paths)Test/Coverage/cov_gmsh_io.tcl— Comprehensive gmsh I/O test — exercises both v2 and v3 readersTest/Coverage/cov_gmsh_read.tcl— Confirm both gmsh v2 and v3 ASCII formats load and produce non-zero integralsTest/Coverage/cov_grid_shift_coord.tcl— Exercise grid operations and coordinate pathsTest/Coverage/cov_high_order_1d.tcl— 1D P2 patch test: Laplace on Edge3 meshTest/Coverage/cov_high_order_1d_p3.tcl— 1D P3 cubic patch test: Laplace on EdgeP meshTest/Coverage/cov_high_order_1d_p4.tcl— 1D P4 quartic patch test: Laplace on EdgeP meshTest/Coverage/cov_high_order_quad8.tcl— 2D P2 patch test on quad mesh: Laplace on Quad8 meshTest/Coverage/cov_high_order_tet10.tcl— 3D P2 patch test: Laplace on Tet10 meshTest/Coverage/cov_high_order_tri6.tcl— 2D P2 patch test: Laplace equation on Tri6 meshTest/Coverage/cov_histogram.tcl— cov_histogram.tcl — coverage for src/analysis/stats/histogram.ccTest/Coverage/cov_implant_profile.tcl— Implant with profile generationTest/Coverage/cov_implant_variance.tcl— Implant profile with dose integrationTest/Coverage/cov_integrate_interface.tcl— Interface mesh integration via Material() in integrate commandTest/Coverage/cov_interface_bc.tcl— cov_interface_bc.tcl -- Exercise interface boundary condition paths in Genbc.ccTest/Coverage/cov_interface_cmd.tcl— Interface finder command testTest/Coverage/cov_interface_delta.tcl— Delta function and PDE conservation on a two-region 2D structure.Test/Coverage/cov_internal_etch.tcl— Test InternalEtch.cc — mesh operations during level-set etchingTest/Coverage/cov_interpolate_cmd.tcl— Interpolate command testTest/Coverage/cov_isocontour.tcl— cov_isocontour.tcl -- Exercise MarchingExtract.cc pathsTest/Coverage/cov_kaschro_basic.tcl— kaschro basic Phase-1 coverage:Test/Coverage/cov_kaschro_mirror.tcl— kaschro mirror.kgrid / mirror.mode coverage:Test/Coverage/cov_kaschro_prune.tcl— kaschro Phase-5 coverage:Test/Coverage/cov_kaschro_ritz.tcl— kaschro Phase-6 coverage:Test/Coverage/cov_kaschro_rqi.tcl— kaschro Phase-2 coverage:Test/Coverage/cov_kaschro_track.tcl— kaschro Phase-3 coverage:Test/Coverage/cov_kcharge.tcl— kcharge coverage:Test/Coverage/cov_kcharge_multicomp.tcl— kcharge multi-component coverage:Test/Coverage/cov_koverlap.tcl— koverlap coverage:Test/Coverage/cov_lbte_2d.tcl— LBTE 2D KSpace coverage:Test/Coverage/cov_lbte_kpsi.tcl— LBTE k-dependent ψ retrofit (Phase 6a) coverage:Test/Coverage/cov_lbte_lk_overlap.tcl— LBTE on-the-fly overlap — complex multi-spinor coverage.Test/Coverage/cov_levelset_aniso_etch.tcl— Test anisotropic etch (exercises EtchLvl.cc direction handling)Test/Coverage/cov_levelset_cmp.tcl— Test the CMP etch path through Machine.cc and CMPRate.ccTest/Coverage/cov_levelset_conformal.tcl— Test conformal deposition edge casesTest/Coverage/cov_levelset_crossconnect.tcl— Test multi-material levelset operationsTest/Coverage/cov_levelset_curved_etch.tcl— Levelset etch with step geometry for curved surface coverageTest/Coverage/cov_levelset_deposit_extended.tcl— Extended deposit test with thin layerTest/Coverage/cov_levelset_deposition.tcl— PECVD deposition on step geometry (non-conformal surface)Test/Coverage/cov_levelset_distance.tcl— Test the distance measurement commandTest/Coverage/cov_levelset_eleham.tcl— Test EleHam.cc — LevelSet Hamiltonian for velocity extensionTest/Coverage/cov_levelset_epi.tcl— Test the epi command argument parsing (epitaxial deposition via level set)Test/Coverage/cov_levelset_etch.tcl— Test EtchLvl.cc non-isotropic LevelSet etch pathTest/Coverage/cov_levelset_etch_3d.tcl— 3D levelset isotropic etchTest/Coverage/cov_levelset_etch_meshtype.tcl— Test sequential etch with varying depths (exercises EtchLvl.cc state handling)Test/Coverage/cov_levelset_etch_variants.tcl— Levelset etch operationsTest/Coverage/cov_levelset_grid_refine.tcl— Test LevelSet grid refinement (exercises RectGrid.cc operations)Test/Coverage/cov_levelset_init_edge.tcl— Test LevelSet initialization edge casesTest/Coverage/cov_levelset_internal_etch.tcl— Test level set etch with internal mesh reconstruction (InternalEtch)Test/Coverage/cov_levelset_isotropic_etch.tcl— Isotropic etch on step geometryTest/Coverage/cov_levelset_masked_deposit.tcl— Test varied rate deposition (exercises DepLvl.cc rate expression handling)Test/Coverage/cov_levelset_material_select.tcl— Levelset operation on selected materialTest/Coverage/cov_levelset_measurements.tcl— Test AFM, curvature, and thickness measurement commandsTest/Coverage/cov_levelset_multimaterial.tcl— Test multi-material LevelSet operationsTest/Coverage/cov_levelset_multistep.tcl— Test multi-step LevelSet operations (deposit, then etch)Test/Coverage/cov_levelset_oxidize.tcl— Test the IsMeshingDisabled() early-return path in MeshDepositionTest/Coverage/cov_levelset_regrow.tcl— Level set deposit/etch extended coverage testTest/Coverage/cov_levelset_sputter.tcl— Sputter deposition on step geometry (non-conformal surface)Test/Coverage/cov_levelset_velocity.tcl— cov_levelset_velocity.tcl -- Exercise VelLvl.cc velocity pathsTest/Coverage/cov_levelset_velocity_ext.tcl— Test VelLvl.cc — velocity level-set calculationsTest/Coverage/cov_lk_rotation.tcl— Test that BuildH110 produces the same band structure as BuildHTest/Coverage/cov_ls_crossconnect.tcl— Exercise CrossConnect via etch on simple 2D geometryTest/Coverage/cov_ls_deposit_modes.tcl— Deposit mode coverage via machine commandTest/Coverage/cov_ls_epi_growth.tcl— Exercise additional deposit pathsTest/Coverage/cov_ls_extended_ops.tcl— Extended LevelSet operations targeting VelLvl.cc and LevelSet.ccTest/Coverage/cov_ls_levelset_ops.tcl— LevelSet.cc main operations coverage — exercises uncovered pathsTest/Coverage/cov_ls_machine_ext.tcl— Machine command extended coverage — exercises Machine.cc uncovered pathsTest/Coverage/cov_ls_sputter_etch.tcl— Sputter deposition coverage — exercises SputterLvl.cc uncovered pathsTest/Coverage/cov_ls_velocity_modes.tcl— Velocity modes coverage — exercises VelLvl.cc uncovered pathsTest/Coverage/cov_main_options.tcl— Test main.cc and Options.cc — command-line option parsing and options commandTest/Coverage/cov_mask_positive.tcl— Mask command: positive mask type, list, clear, multiple rectanglesTest/Coverage/cov_mater_commands.tcl— Test mater command branches: all, list, addTest/Coverage/cov_material_properties.tcl— Material field operationsTest/Coverage/cov_math_ilu.tcl— Test ILU and Jacobi preconditioners (math/Precond.cc)Test/Coverage/cov_math_precond.tcl— Test different iterative solver and preconditioner configurationsTest/Coverage/cov_math_row_scale.tcl— Test CompRow matrix format and scaling paths (math/matrix.cc, math/Precond.cc)Test/Coverage/cov_matrix_transpose.tcl— Exercise matrix TransposeMult via row-based matrix with column scalingTest/Coverage/cov_mc_implant.tcl— MC implant coverage testTest/Coverage/cov_mc_movie_interval.tcl— `mc movie= ... movie.interval= N` — runs the user's Tcl hook every NthTest/Coverage/cov_mc_tabulated_rates.tcl— `mc scatter.tabulated= ...` — bridge from the shared rate registryTest/Coverage/cov_meff_update.tcl— Coverage test for the "schrodinger update" path (UpdateGeneralMeff inTest/Coverage/cov_memory_cap.tcl— Exercise the `memory cap=` setter.Test/Coverage/cov_memory_cmd.tcl— Exercise the `memory` Tcl command.Test/Coverage/cov_mesh_3d_adapt.tcl— Test 3D mesh adaptation and topology operationsTest/Coverage/cov_mesh_adapt_gradient.tcl— Mesh adaptation based on solution gradient during diffusionTest/Coverage/cov_mesh_element_ops.tcl— Mesh element operationsTest/Coverage/cov_mesh_operations.tcl— cov_mesh_operations.tcl -- Exercise field manipulation and sel pathsTest/Coverage/cov_mesh_smooth.tcl— Test mesh smoothing and quality reporting on 1D and 2D meshesTest/Coverage/cov_mirror_1d.tcl— Cov-Mirror-1D — exercise mirror command on a 1D mesh.Test/Coverage/cov_mirror_2d.tcl— Cov-Mirror-2D — exercise mirror on a 2D mesh.Test/Coverage/cov_mirror_3d.tcl— Cov-Mirror-3D — exercise mirror on a 3D mesh.Test/Coverage/cov_mirror_errors.tcl— Cov-Mirror-Errors — exercise the error paths in mirror_tcl.Test/Coverage/cov_mirror_n2.tcl— Cov-Mirror-N2 — exercise the n>1 linear-march branch of mirror.Test/Coverage/cov_mosfet_process.tcl— Implant + diffuse + device solve flow (exercises broad code paths)Test/Coverage/cov_multicontact_device.tcl— Multi-contact device coverage testTest/Coverage/cov_multiregion_pde.tcl— cov_multiregion_pde.tcl -- Multi-region PDE with interface BCs using solution commandTest/Coverage/cov_newton_modes.tcl— cov_newton_modes.tcl -- Exercise Newton.cc convergence and damping pathsTest/Coverage/cov_nodedata_operations.tcl— Node data operations and position-based fieldTest/Coverage/cov_noise_analysis.tcl— Exercise DevControl.cc device store/restore/clear and transient with movieTest/Coverage/cov_options_extended.tcl— Exercise additional Options.cc pathsTest/Coverage/cov_orientation_aniso.tcl— Tcl set_aniso_elastic / set_transverse_iso_elastic coverage.Test/Coverage/cov_oxidation_2d.tcl— Level set deposit + etch + diffuse flow (exercises broad cross-module paths)Test/Coverage/cov_p2_poisson_gaa_const_ordered_quad8.tcl— P2 Quad8 GAA: workaround ordering. See cov_p2_poisson_gaa_const_ordered_tri6.tclTest/Coverage/cov_p2_poisson_gaa_const_ordered_tri6.tcl— P2 Tri6 GAA: workaround ordering — add interface contact BEFORE flps_gridTest/Coverage/cov_p2_poisson_gaa_const_quad8.tcl— P2 Quad8 GAA constant-Dirichlet test. See cov_p2_poisson_gaa_const_tri6.tclTest/Coverage/cov_p2_poisson_gaa_const_tri6.tcl— P2 Tri6 GAA constant-Dirichlet test: regression cover for theTest/Coverage/cov_parse_expand.tcl— Parse.cc Expand() and Scan() coverageTest/Coverage/cov_pde_2d_assembly.tcl— cov_pde_2d_assembly.tcl -- Exercise 2D PDE assembly pathsTest/Coverage/cov_pde_3d_assembly.tcl— cov_pde_3d_assembly.tcl -- Exercise 3D PDE assembly pathsTest/Coverage/cov_pent_brick.tcl— cov_pent_brick.tcl -- Exercise Pent.cc and Brick.cc element pathsTest/Coverage/cov_plot2d_3d_slicing.tcl— Test plot2d with 3D slicing along x, y, z axesTest/Coverage/cov_plot_line_extract.tcl— Field extraction and statistics on 2D meshTest/Coverage/cov_pod_solve.tcl— POD-projected Newton solve coverage testTest/Coverage/cov_poisson_schrodinger.tcl— Minimal Poisson-Schrodinger coupled solver testTest/Coverage/cov_profile_extended.tcl— Extended profile command coverageTest/Coverage/cov_profile_extract.tcl— Test profile import and layers commandTest/Coverage/cov_profile_io.tcl— Profile command with file I/O and various optionsTest/Coverage/cov_quad_all_funcs.tcl— Exercise ALL QuadEvaluate/QuadDerivative paths via quad() in PDETest/Coverage/cov_quad_mesh_diffuse.tcl— Test quad (triangular) mesh creation and diffuseTest/Coverage/cov_quad_struct.tcl— Test Quad element operations: struct I/O, multi-material, field opsTest/Coverage/cov_rate_errors.tcl— Cov-RateErrors — error-path coverage for `rate` Tcl command parserTest/Coverage/cov_rate_eval.tcl— `rate eval` — one-shot scalar value of a registered rate at a point onTest/Coverage/cov_rate_ff_namedconst.tcl— rate-registry named-ConstTable FF binding consumption coverage:Test/Coverage/cov_rate_ff_qspatialotf.tcl— rate-registry QSpatialOTF form-factor binding coverage:Test/Coverage/cov_rate_paint.tcl— `rate paint` — substitutes scratch into a registered eqn and paints theTest/Coverage/cov_rate_register.tcl— `rate` Tcl command — register / list / dump round-trip coverage.Test/Coverage/cov_rate_substitute.tcl— `rate substitute` — word-boundary substitution of walker scratchTest/Coverage/cov_rectgrid_contour.tcl— Level set contour and RectGrid operationsTest/Coverage/cov_refine.tcl— Refinement using the refine command — smoke test across element typesTest/Coverage/cov_refine_delta.tcl— Delta integration remains correct after refine err=1.Test/Coverage/cov_remove_ops.tcl— Test Remove.cc — mesh element removal/collapse operationsTest/Coverage/cov_ritz_complex.tcl— #####################################################################Test/Coverage/cov_ritz_hmode_cplx.tcl— #####################################################################Test/Coverage/cov_row_matrix.tcl— Exercise CompRowMatrix::FinishLoad pathsTest/Coverage/cov_schrodinger_arpack.tcl— ARPACK iterative eigensolver + real update/geteig path coverageTest/Coverage/cov_schrodinger_complex.tcl— Complex Hermitian Schrodinger (BdG) path coverageTest/Coverage/cov_schrodinger_materials.tcl— Multi-material field operationsTest/Coverage/cov_segregation_trap.tcl— Segregation and interface trapping coverage testTest/Coverage/cov_sel_advanced.tcl— cov_sel_advanced.tcl -- Exercise select expression evaluation pathsTest/Coverage/cov_sel_cnst_collision.tcl— sel-vs-CNST name collision guardTest/Coverage/cov_sel_delete.tcl— sel delete — remove a named data fieldTest/Coverage/cov_sige_alloy.tcl— SiGe alloy equations test at x=0.3 (30% Ge).Test/Coverage/cov_sige_eqns.tcl— SiGe multi-valley equations test.Test/Coverage/cov_sige_params.tcl— SiGe material parameter endpoint verification.Test/Coverage/cov_slice_2d.tcl— 2D structure with gmsh_geo_contour_write covering PlotLine and PlotSegTest/Coverage/cov_solution_commands.tcl— cov_solution_commands.tcl -- Exercise Solution.cc command pathsTest/Coverage/cov_solution_extended.tcl— Exercise Solution.cc extended pathsTest/Coverage/cov_solution_management.tcl— Solution management command coverageTest/Coverage/cov_solution_ops.tcl— Exercise Solution.cc pathsTest/Coverage/cov_static_mathfuncs.tcl— Exercise Static.cc math function paths via Newton PDE solvingTest/Coverage/cov_stats.tcl— cov_stats.tcl — coverage for src/analysis/stats/stats.ccTest/Coverage/cov_stress_2d.tcl— Test 2D dimensional vector PDE assembly (stress solver)Test/Coverage/cov_stress_eqnmap.tcl— Test stress solver without skipmap (exercises matrix map-building paths)Test/Coverage/cov_stress_extended.tcl— Extended 2D stress with anisotropic elastic constants and calcstressTest/Coverage/cov_struct_3d_write.tcl— 3D struct write/read coverage for multi-material meshes with contactsTest/Coverage/cov_struct_extended.tcl— Extended struct write/read coverage for 2D multi-material meshesTest/Coverage/cov_struct_mesh_import.tcl— Test struct reading of Triangle and TetGen mesh formatsTest/Coverage/cov_struct_mixed.tcl— Exercise Mixed.cc mesh generation using vertex/block/mesh commandsTest/Coverage/cov_struct_write_extended.tcl— Exercise struct write paths for multiple output formatsTest/Coverage/cov_struct_write_formats.tcl— Test structure write format variationsTest/Coverage/cov_superbound_ops.tcl— Test SuperBound.cc and Edge3.cc — super-element boundary operations and 3D edge elementsTest/Coverage/cov_superconductor_funcs.tcl— Superconductor and Fermi-Dirac integral functionsTest/Coverage/cov_tasch_implant.tcl— Tasch implant model testTest/Coverage/cov_tclmath.tcl— Test Tcl math functions registered in tclMath.cTest/Coverage/cov_tdr.tcl— Exercise the `struct tdr=` reader on a sample TDR mesh.Test/Coverage/cov_temp_material.tcl— Temperature-dependent material property evaluation testTest/Coverage/cov_tensor_aniso.tcl— Exercise Tensor.cc anisotropic line spacing (before/after parameters)Test/Coverage/cov_test_adapt.tcl— Test adapt command exercising mesh adaptation internalsTest/Coverage/cov_test_data.tcl— Test the standalone test_data C++ test harnessTest/Coverage/cov_test_distance.tcl— Test the standalone test_distance C++ test harnessTest/Coverage/cov_test_element.tcl— cov_test_element.tcl -- Exercise Element/Tri/Quad/Node geometry paths via test harnessTest/Coverage/cov_test_element_1d.tcl— cov_test_element_1d.tcl -- Exercise Element paths in 1DTest/Coverage/cov_test_face.tcl— cov_test_face.tcl -- Exercise Face/Edge/Volume/Tet geometry pathsTest/Coverage/cov_test_face_3d.tcl— cov_test_face_3d.tcl -- Exercise Face/Edge/Volume/Tet geometry in 3DTest/Coverage/cov_test_mesh.tcl— cov_test_mesh.tcl -- Exercise Mesh geometry pathsTest/Coverage/cov_test_utils_3d.tcl— Test the standalone test_utils_3d C++ test harnessTest/Coverage/cov_tif.tcl— Exercise the `struct tif=` reader on a sample TIF mesh.Test/Coverage/cov_time_3d_init.tcl— 3D init timing benchmark — ~58x58x60 = ~200k nodesTest/Coverage/cov_time_3d_read.tcl— 3D read benchmark — generate ~200k node mesh, save as .str, then re-read itTest/Coverage/cov_traps.tcl— Minimal interface trap testTest/Coverage/cov_tspline.tcl— tspline N-D tensor spline lookup table.Test/Coverage/cov_tspline_slice.tcl— cov_tspline_slice.tcl — `tspline slice` projects an N-axis table ontoTest/Coverage/cov_userparam_types.tcl— Exercise UserParam help and parsing pathsTest/Coverage/cov_utils_3d.tcl— Test 3D geometry utilities via C++ test harnessTest/Coverage/cov_validateunits.tcl— Exercise the validateunits / defineunit Tcl commands.Test/Coverage/cov_values_ops.tcl— Exercise Values.cc and Derivs paths via PDE expressions with relational opsTest/Coverage/cov_vertex.tcl— Tests vertex commandTest/Coverage/cov_vertex_block.tcl— Vertex construction and dumpTest/Coverage/cov_voronoi_2d.tcl— Exercise Voronoi2D.cc — Delaunay edge swappingTest/Coverage/cov_voxel_dump.tcl— Cov-VoxelDump — exercise `dumpvoxelgmsh` (src/field/voxel/voxel_dump.cc).Test/Coverage/diffuse_2d.tcl— 2D spatial diffusion testTest/Coverage/diffuse_basic.tcl— Basic diffusion test - Gaussian spreadingTest/Coverage/expr_advanced.tcl— Test Alagator expressions: multi-solution PDE assembly and post-processingTest/Coverage/implant_basic.tcl— Basic ion implantation testTest/Coverage/implant_dual.tcl— Dual Pearson implant distribution for Boron in siliconTest/Coverage/mater_ops.tcl— Test material database operationsTest/Coverage/matrix_gmres.tcl— Test GMRES iterative solver pathsTest/Coverage/matrix_ops.tcl— Test matrix solver paths not covered by existing matrix testsTest/Coverage/mesh_adapt.tcl— Test 2D mesh operations and data fieldsTest/Coverage/mesh_regrid.tcl— Test mesh adaptation via flps_grid regrid and smooth commandsTest/Coverage/multiregion_diffuse.tcl— Two-region diffusion with flux continuity at interfaceTest/Coverage/nodedata_2d.tcl— Test node data operations in 2D meshTest/Coverage/oned_levelset.tcl— 1D LevelSet Deposit and EtchTest/Coverage/pn_diode_sg.tcl— 1D PN diode with Scharfetter-GummelTest/Coverage/poisson_1d.tcl— 1D Poisson equation with known analytic solutionTest/Coverage/profile_cmd.tcl— Test the profile command for reading SIMS-like dataTest/Coverage/sel_ops.tcl— Test sel expression operations and math functionsTest/Coverage/struct_formats.tcl— Test all structure command output formatsTest/Coverage/struct_io.tcl— Test structure file write and read-backTest/Coverage/updatecoords.tcl— Apply a z-displacement field via `updatecoordinates disp=` on a 2D Oxide/SiliconTest/Coverage/updatecoords_abs.tcl— Verify the "coordinates=" variant of updatecoordinates: pass an absoluteTest/Coverage/vel_grad_pde.tcl— Test VelX/VelY/VelZ discrete velocity functions with GradX/GradY/GradZ arguments
alagator (1)
Test/alagator/Functions.tcl— Sweeps the Alagator built-in function set (log/exp/trig/erf/sqrt/grad/Fermi/fsc) by integrating each over a 1D Silicon slab and checking the summed result.
device (62)
Test/device/contact-spec/POD_sweep.tcl— Ramp a 1D resistor contact from 0 to 5V twice (FEQF POD reduced-order vs fullTest/device/contact-spec/contact_specifications.tcl— 1D diode at 0.05V using Boltzmann (DevPsi/Qfn/Qfp) drift-diffusion, then re-runs theTest/device/contact-spec/inherit.tcl— Sweep a 1D pn diode IV with two structures: a single-Silicon-region "OldTest" andTest/device/densitygradient/1ddg.tcl— 1D MOS capacitor (oxide on n-Si) ramped to -10V on the gate with FEQF density-gradientTest/device/densitygradient/1ddg_scat.tcl— 1D electron-only FEQF resistor with optional point-source scattering, swept twice:Test/device/densitygradient/1ddg_scat_hole.tcl— 1D hole-only FEQF resistor with optional point-source scattering, swept twice:Test/device/densitygradient/2D.tcl— 2D n-type MOS cap (oxide/silicon) at Vg=+4V, sweeping density-gradient gammaTest/device/densitygradient/2DHole.tcl— 2D p-type MOS cap (oxide/silicon) at Vg=-4V, comparing classical Fermi-Dirac holeTest/device/densitygradient/dg2.tcl— 1D MOS cap iterated with DGEquation-driven Lambda updates followed by aTest/device/densitygradient/dg_simp.tcl— 1D MOS cap (Fermi-Dirac F12 electron statistics) at Vg=+4V, sweepingTest/device/densitygradient/dg_simp_boltz.tcl— 1D MOS cap (Boltzmann Nc*exp electron statistics) at Vg=+4V, sweepingTest/device/generation/ZenerTest.tcl— Loads a 1D refined structure and ramps an emitter contact past Zener breakdownTest/device/hemt/hemt_floods.tcl— AlGaN/GaN HEMT using floods equation procsTest/device/mos/ACTest.tcl— 2D MOSFET ramped from Vg=-3 to +3V, comparing the DC gate capacitance (finite-differenceTest/device/mos/mosfet.tcl— 2D NMOS with explicit DevPsi/Elec/Hole Scharfetter-Gummel drift-diffusion (sgrad),Test/device/nopdb/poisson.tcl— Solve a 1D Poisson-like PDE on a Silicon bar with fixed contacts at both ends, exercising the post-pdb-removal solution+contact stack.Test/device/picard/picard-single.tcl— Single-process Picard iteration: decompose into N subdomains, sweep them serially in one interpreter, and time vs. the monolithic device solve.Test/device/picard/picard_master.tcl— Driver for Picard domain-decomposition: split a 3D Silicon cube into N subdomains, dispatch picard_slave.tcl per piece, recombine, and iterate to convergence against the analytic answer.Test/device/picard/picard_slave.tcl— Helper: worker invoked by picard_master.tcl for subdomain $argv[0]; loads the partitioned struct, solves the local Foo PDE, writes picard.<n>.str.Test/device/pod/densesolve.tcl— Exercise the `densesolve` Tcl command (LAPACK dgesv wrapper) on 2x2 identity, 2x2 general, and 3x3 systems with hand-computed answers.Test/device/pod/spline.tcl— Exercise the `spline` Tcl command: error paths for malformed xlist/ylist/val arguments, then sweep linear and cubic interpolation against a 1D field for several quadratic-curve test cases.Test/device/quantum/PoissonSchrodinger/1d-elec.tcl— Self-consistent 1D Poisson-Schrodinger MOS-cap solve for electrons at Vg=1.0V, checking the inversion-layer sheet density against a gold value.Test/device/quantum/PoissonSchrodinger/1d-hole.tcl— Self-consistent 1D Poisson-Schrodinger MOS-cap solve for holes at Vg=-0.3V using the k.p Schrodinger100SolveKP path, checking the accumulation-layer sheet density against a gold value.Test/device/quantum/PoissonSchrodinger/kp_test.tcl— 1D delta-doped Si MOS-cap Poisson-Schrodinger test with optional double delta layer, exercising the k.p Schrodinger path through multi-region SiliconSub/SiliconDouble inheritance.Test/device/quantum/Tunnel/kp_test.tcl— 1D delta-doped Si MOS-cap k.p tunneling variant (Tunnel/): no SchrodingerMask, exercises the tunnel solve path on top of Poisson-Schrodinger.Test/device/quantum/Tunnel/sweep-ge-paper.tcl— Germanium MOS-cap tunneling reproduction: top/bottom gate sweep on Ge between two oxides with k.p band parameters, replicating the Ge paper figure.Test/device/quantum/Tunnel/sweep_test.tcl— 1D delta-doped Si MOS-cap with tunneling: stripped/sped-up cousin of sweep-ge-paper.tcl, drives Poisson-Schrodinger plus the tunnel solve over a small gate bias sweep.Test/device/resistor/1dgrid.tcl— Helper: builds a 1D Silicon bar (0 to 1 um, 0.1 spacing) with VSS/GND ohmic contacts. Sourced by pn.tcl, pn_advection.tcl, qf.tcl, sg.tcl, etc.Test/device/resistor/4hsic.tcl— 1D 4H-SiC NP resistor: ramp VSS to 1V and check FEQF ohmic current against gold, exercising the 4HSiC material model end-to-end.Test/device/resistor/PNdiode.tcl— 1D PN diode forward sweep on the legacy DevicePackage stack (DevPsi/Elec/Hole alagator equations), not the FEQF wrapper.Test/device/resistor/ThrowTest.tcl— 2D MOSFET deck that intentionally drives the device solve into divergence and asserts that the failure surfaces as a Tcl-catchable error (not a panic).Test/device/resistor/cache_bug.tcl— Regression for the ExprStore cache bug where `sel z= 0 name= DevPsi` followed by `sel z= Elec` would read a stale cached value instead of recomputing from the FEQF expression.Test/device/resistor/pn.tcl— 1D PN diode FEQF ramp with on-the-fly plotting of Eval and Qfp during the contact sweep, smoke-testing the FEQF + plot interaction.Test/device/resistor/pn_advection.tcl— 1D PN-junction advection diagnostic: solve FEQF on a step-doped diode and decompose the contact current into drift, diffusion, and gradient components via alagator expressions.Test/device/resistor/qf.tcl— 1D PN resistor with FEQF + legacy Silicon equations: ramp VSS to 1V, check ohmic current to 1% against gold.Test/device/resistor/qf_high.tcl— 1D PN diode under high doping (1e20 both sides) on a 100 nm scale, stressing the FEQF quasi-Fermi solver near degeneracy.Test/device/resistor/resist.tcl— 1D Silicon resistor on the legacy DevicePackage stack: declares DevPsi/Elec/Hole solutions explicitly (no FEQF wrapper) and ramps the VSS contact.Test/device/resistor/sg.tcl— 1D Silicon resistor on the Scharfetter-Gummel device stack: p-type and n-type symmetric checks against gold ohmic current to validate the legacy SG path against FEQF.Test/device/segregation/Seg2.tcl— Si/Oxide impurity segregation across an interface with explicit alagator side equations, verifying mass conservation via FindDose2D dose integrals.Test/device/segregation/Segregation.tcl— 1D Gaussian impurity diffusing in silicon between two oxide caps, exercising the diffuse solver and layers/integrate dose accounting.Test/device/strain/PiezoHall/factor.tcl— 2D piezo-Hall test on a 30x30 um square: legacy mobility equations with __Hall flag at T=Temp and T=300, comparing the hall factor before/after switching.Test/device/strain/PiezoHall/partial.tcl— 2D piezo-Hall test on a 30x30 um square: current Silicon::Eqns (non-legacy) path with __Hall flag, complementing factor.tcl's legacy comparison.Test/device/strain/PiezoHall/square.tcl— Helper: builds the 30x30x1 um Silicon square mesh used by the PiezoHall test decks (factor.tcl, partial.tcl).Test/device/strain/PiezoResistance/electrons/current.tcl— 2D Si n-resistor piezo-DP electron mobility baseline: ramp VSS to 0.2V on legacy equations, capture the bias current as the unstrained reference.Test/device/strain/PiezoResistance/electrons/nDP.tcl— 2D Si n-resistor piezo-DP electron mobility check: ramp to 0.5V, then sweep uniaxial stress (Si::UniformStress) and verify the current shift matches the deformation-potential model.Test/device/strain/PiezoResistance/electrons/nKanda.tcl— 2D Si n-resistor piezo-Kanda electron mobility check: ramp to 0.5V with Silicon::KandaEqns at (001)<100> and verify the Kanda piezo-coefficient prediction.Test/device/strain/PiezoResistance/electrons/optimize/nDPbrute.tcl— SLURM-driven brute-force grid search over Si electron deformation-potential parameters (Xid, Xiu, f) by repeatedly invoking nDPerror.tcl and tabulating the error.Test/device/strain/PiezoResistance/electrons/optimize/nDPerror.tcl— Error functional for the electron-DP optimizer: takes a parameter list on $argv, drives the 2D Si n-resistor at 0.5V, and emits the current as the optimizer's objective.Test/device/strain/PiezoResistance/electrons/optimize/nDPoptimize.tcl— SLURM-driven optimizer for Si electron deformation-potential parameters: applies range penalties and shells out to nDPerror.tcl per evaluation.Test/device/strain/PiezoResistance/electrons/optimize/pDPerror.tcl— Misplaced hole-DP error variant kept under electrons/optimize: drives the 2D n-resistor at 0.5V for the hole-DP optimizer's objective; logical sibling lives under holes/optimize/.Test/device/strain/PiezoResistance/holes/current.tcl— 2D Si p-resistor piezo-DP hole mobility baseline: ramp VSS to 0.2V on legacy hole equations, capture the bias current as the unstrained reference.Test/device/strain/PiezoResistance/holes/optimize/pDPerror.tcl— Error functional for the hole-DP optimizer: takes a k.p strain parameter list on $argv, applies uniform stress, drives the 2D Si p-resistor at the bias point, and emits the current.Test/device/strain/PiezoResistance/holes/optimize/pDPoptimize.tcl— SLURM-driven optimizer for Si hole deformation-potential / k.p parameters: applies range penalties and shells out to pDPerror.tcl per evaluation.Test/device/strain/PiezoResistance/holes/pDP.tcl— 2D Si p-resistor piezo-DP vs piezo-Kanda hole-mobility cross-check: stress-sweep the resistor and compare DP-extracted piezo-coefficients to Kanda model values.Test/device/strain/PiezoResistance/holes/pDP2.tcl— 2D Si p-resistor piezo-DP hole mobility check (variant 2, no EqnsLegacy seed): ramp to 0.5V, sweep stress, compare current shift to deformation-potential model.Test/device/strain/PiezoResistance/holes/pKanda.tcl— 2D Si p-resistor piezo-Kanda hole mobility check at (001)<100>: ramp to 0.5V with zero-stress KandaEqns and verify the unstrained-current baseline matches the Kanda model.Test/device/strain/grid_2D.tcl— Helper: builds the 2D Silicon square (1x1 um, quad mesh) with X- or Y-direction contacts used by the PiezoResistance electrons/holes test decks.Test/device/strain/grid_3D.tcl— Helper: builds a 3D Silicon cube (1x1x1 um, tet/brick mesh) with selectable contact orientation, sourced by 3D strain test decks.Test/device/traps/InterfaceTraps-Edge.tcl— NMOS/PMOS gate-bias sweep of a band-edge interface trap distribution: $argv selects polarity and trap type (donor/acceptor), then ramps gate and records the C-V shift to a .dat file.Test/device/traps/InterfaceTraps-Mid.tcl— NMOS/PMOS gate-bias sweep of a mid-gap interface trap distribution: $argv selects polarity and trap type (donor/acceptor), then ramps gate and records the C-V shift to a .dat file.Test/device/traps/RunTraps.tcl— Driver: shells out to InterfaceTraps-Edge.tcl and InterfaceTraps-Mid.tcl for all four NMOS/PMOS x acceptor/donor combinations, then sums the resulting .dat files into a pass/fail check.Test/device/traps/support.tcl— Helper: defines MosGrid/NMosGrid/PMosGrid mesh+contact procs and the RampPlot C-V sweep proc, sourced by InterfaceTraps-Edge.tcl and InterfaceTraps-Mid.tcl.
fft (1)
Test/fft/fft_test.tcl— Forward + inverse fftmesh round-trip on a 1D field; verifies the recovered integral matches the original.
mc (3)
Test/mc/mc_1d.tcl— 1D MC test: all three phasesTest/mc/mc_2d.tcl— 2D MC test: all three phasesTest/mc/mc_3d.tcl— 3D MC test: all three phases
mirror (1)
Test/mirror/mirror_2d_multi_region.tcl— mirror_2d_multi_region — 2D oxide-on-silicon stack mirrored about Right.
misc (1)
Test/parallel.tcl
process (41)
Test/process/diffuse/DiffComp.tcl— Compare linear diffusion of a Gaussian As profile across 1D, 2D (tri and quad), and 3D (tet and brick) meshes to verify junction depth agreement and time the mesh variants.Test/process/diffuse/DiffNonLin.tcl— Drive nonlinear concentration-dependent diffusion of a Gaussian dopant in 1D via an Alagator PDE with a Test/1e19 prefactor and watch the profile evolve under diffuse.Test/process/diffuse/Seg1v2.tcl— Exercise oxide/silicon interface segregation of a diffusing impurity in 1D and 2D (cylindrical and planar), checking dose conservation across the segregation boundary via integrated layer doses.Test/process/diffuse/SurfRecomb.tcl— Transient interstitial-diffusion test under an RTA ramp: seed implant damage (Inter), advance with an Arrhenius-temperature-dependent grad(Inter/CIStar) PDE, and apply a kink-site surface recombination BC at the oxide/silicon interface, checking final temperature and surface concentration against gold.Test/process/diffuse/Trap.tcl— Drive 1D oxide/silicon Imp diffusion with an interface trap-saturation PDE term (1e14-Imp)*Imp(Silicon) plus an oxide-side surface loss, sampling trapped-charge evolution at the interface and gating on the integrated final dose.Test/process/implant/FindDose.tcl— Helper: FindDose1D and FindDose2D procs that sum positive Silicon-layer doses reported by the `layers` command in 1D and along a y-cut in 2D, used by the Halo* implant decks.Test/process/implant/Halo2D.tcl— Implant 65 keV arsenic at tilts 0/15/30/45/60 degrees through a 2D nitride-spacer/poly-gate/oxide/silicon halo structure and check the summed dose across all five tilts against a gold value.Test/process/implant/HaloDim.tcl— Cross-check 2D tilted/rotated arsenic implants against an equivalent 1D implant — implant at tilt=30 with rot=0/90/180/270 in a 2D oxide/silicon stack, then repeat in a 1D stack, and compare integrated Silicon doses to gold values.Test/process/implant/HaloRot.tcl— Implant 65 keV arsenic at fixed 30-degree tilt with rotations of 0/90/180/270 degrees through a 2D nitride-spacer/poly-gate/oxide/silicon halo structure and verify the per-rotation integrated Silicon dose against gold values.Test/process/implant/Tilt1D.tcl— Implant 65 keV arsenic at tilts 0/15/30/45/60 degrees through a 1D oxide/silicon stack and verify the per-tilt integrated Silicon dose against gold values (validates the 1D tilt projection).Test/process/lattice/lattice.tcl— Lattice command: generate 2D/3D crystalline node layouts for Silicon (default, fcc, bcc, diamond) and compare against gold structures.Test/process/levelset/3D/dep_internal.tcl— #########################################################################Test/process/levelset/3D/etch_aniso.tcl— #########################################################################Test/process/levelset/3D/etch_iso_3D.tcl— 3D isotropic etch of an Oxide layer through a HardMask slit, verifying remaining-volume integral against a gold value.Test/process/levelset/3D/etch_multi.tcl— #########################################################################Test/process/levelset/3D/etch_tmp.tcl— 3D anisotropic + isotropic etch of an Oxide layer through two rectangular negative masks (metal trench + circular via cutout), against a gold structure.Test/process/levelset/3D/etch_try.tcl— 3D isotropic etch of an Oxide region through a negative mask slit; writes a gmsh debug mesh (no PASS/FAIL gate — exploratory deck).Test/process/levelset/3D/etch_via.tcl— 3D isotropic etch of an Oxide trench through a negative mask, verifying remaining-volume integral against a gold value.Test/process/levelset/3D/etch_via_law.tcl— 3D isotropic etch of an Oxide via under a HardMask, comparing the resulting structure to a gold .str file.Test/process/levelset/3D/refine3d.tcl— 3D mesh-adapt refine on a gas/Oxide layout (no level-set motion), comparing the refined structure against a gold .str file.Test/process/levelset/3D/wire.tcl— 3D unmasked Silicon etch driven by an Alagator field expression (MoleFractionRate) wired into an alagator machine — exercises spatially varying rate without masks.Test/process/levelset/aniso_ang.tcl— #########################################################################Test/process/levelset/backend.tcl— #########################################################################Test/process/levelset/cavity.tcl— #########################################################################Test/process/levelset/dep_grid.tcl— #########################################################################Test/process/levelset/etch_2mask.tcl— #########################################################################Test/process/levelset/etch_2mask_interpolate.tcl— #########################################################################Test/process/levelset/etch_aniso.tcl— #########################################################################Test/process/levelset/etch_aniso_internal.tcl— #########################################################################Test/process/levelset/etch_aniso_machine.tcl— #########################################################################Test/process/levelset/etch_aniso_oxide.tcl— #########################################################################Test/process/levelset/etch_cmp.tcl— #########################################################################Test/process/levelset/etch_iso.tcl— #########################################################################Test/process/levelset/fullflow_anod.tcl— #########################################################################Test/process/levelset/fullflow_demo_seed.tcl— #########################################################################Test/process/levelset/masknegpos.tcl— #########################################################################Test/process/levelset/plasma.tcl— Plasma etch of an Oxide via with ion-flux + reflection parameters (sp1, ref, volt, ion) through a negative mask, comparing remaining-material integral to a gold.Test/process/levelset/spacer.tcl— Spacer-formation flow on Silicon: deposit oxide + poly, masked aniso poly etch to form gate stacks, conformal oxide deposit, then unmasked aniso oxide etch to leave sidewall spacers.Test/process/levelset/sputter1.tcl— #########################################################################Test/process/levelset/update_gold.tcl— Helper: regenerates levelset gold .str fixtures by re-running each test deck via $FLOOXS with the update flag; not a test itself.Test/process/misc/profile.tcl— ##################################################
schrodinger (37)
Test/schrodinger/aschro/1DKane.tcl— #####################################################################Test/schrodinger/aschro/LK.tcl— #####################################################################Test/schrodinger/aschro/RayleighProfileReal.tcl— #####################################################################Test/schrodinger/aschro/RayleighTestLarge.tcl— #####################################################################Test/schrodinger/aschro/aschro-real.tcl— 1D Si quantum well, real effective-mass Schrödinger solve through theTest/schrodinger/aschro/aschro.tcl— 1D Si quantum well, real-mode aschro with strain-aware Silicon parameters,Test/schrodinger/aschro/bdg.tcl— Coarse FEA BdG self-consistent solver for an SIS-like Nb/barrier/Nb stack,Test/schrodinger/aschro/overlap.tcl— #####################################################################Test/schrodinger/aschro/ritz-lk-hmode.tcl— #####################################################################Test/schrodinger/aschro/ritz-lk.tcl— 6-band Luttinger-Kohn Hamiltonian: full aschro eigensolve produces a basis,Test/schrodinger/aschro/ritz.tcl— Rayleigh-Ritz projection for 1D effective-mass Schrödinger: builds anTest/schrodinger/bdg/SFS.tcl— Superconductor / Ferromagnet / Superconductor Josephson junction via theTest/schrodinger/bdg/SFS_bdgaschro.tcl— Superconductor / Ferromagnet / Superconductor Josephson junction via theTest/schrodinger/bdg/SIS.tcl— Superconductor / Insulator / Superconductor Josephson junction via theTest/schrodinger/bdg/SIS_bdgaschro.tcl— Superconductor / Insulator / Superconductor Josephson junction via theTest/schrodinger/bdg/SNS.tcl— Superconductor / Normal-metal / Superconductor Josephson junction via theTest/schrodinger/bdg/SNS_bdgaschro.tcl— Superconductor / Normal-metal / Superconductor Josephson junction via theTest/schrodinger/bdg/SimpleBdGGrid.tcl— Helper: defines SimpleBdGGrid, a parametrized Nb / barrier-material / NbTest/schrodinger/bdg/sim.tcl— Inline SIS Nb/Oxide/Nb mesh setup (predates SimpleBdGGrid factoring) thatTest/schrodinger/tb/cov_tb_lattice.tcl— #####################################################################Test/schrodinger/tb/cov_tight_binding.tcl— Minimal tight-binding band structure test — Si, Gamma point onlyTest/schrodinger/tb/params.tcl— Helper: Jancu 1998 sp3d5s* tight-binding parameter sets (PRB 57, 6493)Test/schrodinger/tb/slater.tcl— Helper: Slater-Koster two-center integral procs (s-s, s-p, p-p, s-d, p-d,Test/schrodinger/tb/spds-general.tcl— Helper: builds the sp3d5s* tight-binding Hamiltonian (Jancu et al., PRB 57,Test/schrodinger/tb/spds-test.tcl— Profile-labeled sp3d5s* tight-binding gold-value sweep across C, Si, Ge,Test/schrodinger/tb/tb_params.tcl— #####################################################################Test/schrodinger/tb/test_tb_bdg.tcl— #####################################################################Test/schrodinger/tb/test_tb_heterostructure.tcl— #####################################################################Test/schrodinger/tb/test_tb_lattice_mesh.tcl— #####################################################################Test/schrodinger/tb/test_tb_neighbors.tcl— #####################################################################Test/schrodinger/tb/test_tb_nosoc.tcl— #####################################################################Test/schrodinger/tb/test_tb_silicon.tcl— #####################################################################Test/schrodinger/tb/test_tb_slater_koster.tcl— #####################################################################Test/schrodinger/tb/test_tb_strain.tcl— #####################################################################Test/schrodinger/tb/test_tb_unfold.tcl— #####################################################################Test/schrodinger/tb/test_tb_unfold_supercell.tcl— #####################################################################Test/schrodinger/tb/test_tb_unfold_sweep.tcl— #####################################################################
spice (28)
Test/spice/spice_bjt_ce.tcl— spice_bjt_ce.tcl -- BJT common-emitter operating point.Test/spice/spice_bjt_gp_ce.tcl— spice_bjt_gp_ce.tcl -- Gummel-Poon LEVEL=2 high-injection rolloff.Test/spice/spice_cmos_mixed_picard.tcl— spice_cmos_mixed_picard.tcl -- v13 Test A: mixed CMOS via Picard.Test/spice/spice_diode_dc_sweep.tcl— spice_diode_dc_sweep.tcl -- diode IV via .dc, validated against ngspice-46.Test/spice/spice_diode_op.tcl— spice_diode_op.tcl -- exponential diode forward bias.Test/spice/spice_error_lineno.tcl— spice_error_lineno.tcl -- verify the translator error format carriesTest/spice/spice_inverter_tcad.tcl— spice_inverter_tcad.tcl -- TCAD-MOSFET inverter capstone.Test/spice/spice_jfet_ps_sat.tcl— spice_jfet_ps_sat.tcl -- JFET Parker-Skellern Level 2 short-channel effect.Test/spice/spice_jfet_sat.tcl— spice_jfet_sat.tcl -- JFET in saturation. Analytical Id = Beta*Vgst^2 = 1mA,Test/spice/spice_lc_tank.tcl— spice_lc_tank.tcl -- LC tank at resonance, headline test for v3'sTest/spice/spice_mosfet_l1_sat.tcl— spice_mosfet_l1_sat.tcl -- MOSFET LEVEL=1 in saturation.Test/spice/spice_mosfet_l2_subth.tcl— spice_mosfet_l2_subth.tcl -- LEVEL=2 subthreshold conduction.Test/spice/spice_mosfet_l3_dibl.tcl— spice_mosfet_l3_dibl.tcl -- LEVEL=3 DIBL distinguishing test.Test/spice/spice_mutual_xfmr.tcl— spice_mutual_xfmr.tcl -- transformer with K mutual inductance.Test/spice/spice_picard_transient.tcl— spice_picard_transient.tcl -- v12 Picard transient smoke test.Test/spice/spice_pulse_periodic.tcl— spice_pulse_periodic.tcl -- verify PULSE actually repeats.Test/spice/spice_pulse_rc.tcl— spice_pulse_rc.tcl -- SPICE PULSE source driving an RC, transient via .tran.Test/spice/spice_rc_op.tcl— spice_rc_op.tcl -- SPICE translator vs ngspice on a linear resistor divider.Test/spice/spice_rc_tran.tcl— spice_rc_tran.tcl -- RC step transient through SPICE translator.Test/spice/spice_ring_oscillator.tcl— spice_ring_oscillator.tcl -- Nightly-tier scale test combiningTest/spice/spice_subckt_simple.tcl— spice_subckt_simple.tcl -- two-instance subcircuit expansion + isolation.Test/spice/spice_suffixes.tcl— spice_suffixes.tcl -- exercise comments, suffixes, and continuation.Test/spice/spice_switch_rc.tcl— spice_switch_rc.tcl -- voltage-controlled switch driving an RC.Test/spice/spice_tcad_bridge.tcl— spice_tcad_bridge.tcl -- validate the level=tcad dispatcher contract.Test/spice/spice_tcad_current_drive.tcl— spice_tcad_current_drive.tcl -- SPICE deck drives a NETWORK-mode TCADTest/spice/spice_translate_dryrun.tcl— spice_translate_dryrun.tcl -- validate `spice translate` emits stable Tcl.Test/spice/spice_v_dc_sweep.tcl— spice_v_dc_sweep.tcl -- .dc sweep validates the supply-mutate mechanism.Test/spice/spice_vcvs.tcl— spice_vcvs.tcl -- voltage-controlled voltage source (E line).
unit (15)
Test/unit/matrix/bcgs-ilu.tcl— Smoke test: 3D PN diode drift-diffusion solved with BiCGSTAB iterativeTest/unit/matrix/blasbcgs-ilu.tcl— Smoke test: 3D PN diode drift-diffusion solved with BLAS-backed BiCGSTABTest/unit/matrix/common.tcl— Helper: shared 3D PN-diode drift-diffusion deck sourced by the matrix/Test/unit/matrix/gmres-ilu.tcl— Smoke test: 3D PN diode drift-diffusion solved with GMRES iterativeTest/unit/matrix/jacobi.tcl— Smoke test: 3D PN diode drift-diffusion solved with Jacobi preconditionerTest/unit/matrix/none-ilu.tcl— Smoke test: 3D PN diode drift-diffusion with ILU preconditioner and noTest/unit/matrix/umf.tcl— Smoke test: 3D PN diode drift-diffusion solved with UMFPACK direct LUTest/unit/misc/QFvsSG.tcl— Cross-validates quasi-Fermi (Qfn/Qfp) vs Scharfetter-Gummel (Elec/Hole)Test/unit/misc/fail.tcl— Negative-control test: asserts the test harness correctly reports failureTest/unit/misc/integrate.tcl— Validates that summing per-layer integrals reported by `layers` equals theTest/unit/misc/nodedata.tcl— Exercises struct nodedataout/nodedatain field-only I/O: writes Doping,Test/unit/misc/optimize.tcl— Tests the `optimize` Tcl proc (gradient-descent-style parameter fit) on aTest/unit/misc/pass.tcl— Positive-control test: asserts the test harness correctly reports successTest/unit/misc/schro.tcl— Tests the Schrodinger solver on a 1D parabolic confining potentialTest/unit/utilities/comparestruct.tcl— Exercises field-server comparison: round-trips a 2D grid through struct